مشخصه یابی، آزمایش، اندازه گیری و مترولوژی

دسته: فیزیک، مهندسی مکانیک
مشخصه یابی، آزمایش، اندازه گیری و مترولوژی

سال انتشار: 2020  |  204 صفحه  |  حجم فایل: 26 مگابایت  |  زبان: انگلیسی

Characterization, Testing, Measurement, and Metrology (Manufacturing Design and Technology)
نویسنده:
Chander Prakash, Sunpreet Singh, J. Paulo Davim
ناشر:
CRC Press
ISBN10:
0367275155
ISBN13:
9780367275150

 

قیمت: 8000 تومان

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This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years. The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems. The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.


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